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Robert C. Zak Jr.

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

1992–1992

Best venue rank

C

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
1992ICCDAn IEEE 1149.1 Compliant Testability Architecture with Internal Scan.Robert C. Zak Jr., Jeffrey V. Hill