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Robert Muhr

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

2

Venues

2

Active years

2017–2018

Best venue rank

C

Where they publish

Papers

2 indexed papers, newest first.

YearVenueTitleAuthors
2018ICMLADetecting Star Cracks in Topography Images of Specular Back Surfaces of Structured Wafers.Corinna Kofler, Robert Muhr, Gunter Spck
2017WSCClassifying defects in topography images of silicon wafers.Corinna Kofler, Gunter Spck, Robert Muhr