Roberto di Bella
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2019–2019
Best venue rank
National
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2019 | ICIAP | Wafer Defect Map Classification Using Sparse Convolutional Networks. | Roberto di Bella, Diego Carrera, Beatrice Rossi, Pasqualina Fragneto, Giacomo Boracchi |