Rutger J. van Asselt
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2003–2003
Best venue rank
C
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2003 | CAIP | A New Sharpness Measure Based on Gaussian Lines and Edges. | Judith Dijk, Michael van Ginkel, Rutger J. van Asselt, Lucas J. van Vliet, Piet W. Verbeek |