S. Bohidar
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2003–2003
Best venue rank
C
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2003 | ICCD | Symbolic Failure Analysis of Custom Circuits due to Excessive Leakage Current. | Hui-Yuan Song, S. Bohidar, R. Iris Bahar, Joel Grodstein |