Seung-Yeob Lee
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2017–2017
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2017 | DATE | MVP ECC : Manufacturing process variation aware unequal protection ECC for memory reliability. | Seung-Yeob Lee, Joon-Sung Yang |