Shuichi Saruyama
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
1985–1988
Best venue rank
A*
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1988 | ICCAD | Test generation for sequential circuits using individual initial value propagation. | Takuji Ogihara, Shuichi Saruyama, Shinichi Murai |
| 1985 | DAC | PATEGE: an automatic DC parametric test generation system for series gated ECL circuits. | Takuji Ogihara, Shuichi Saruyama, Shinichi Murai |