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Stefan Radtke

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

1995–1995

Best venue rank

C

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
1995ICCDDistributed automatic test pattern generation with a parallel FAN algorithm.Stefan Radtke, Jens Bargfrede, Walter Anheier