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Syahrizal Salleh

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

2020–2020

Best venue rank

C

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
2020SoMeTOversampling Based on Data Augmentation in Convolutional Neural Network for Silicon Wafer Defect Classification.Uzma Batool, Mohd Ibrahim Shapiai, Nordinah Ismail, Hilman Fauzi, Syahrizal Salleh