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Tat Yan Chan

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

2006–2006

Best venue rank

B

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
2006IJCNNVirtual Metrology Technique for Semiconductor Manufacturing.Yaw-Jen Chang, Yuan Kang, Chin-Liang Hsu, Chi-Tim Chang, Tat Yan Chan