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Thomas Haine

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

2

Venues

2

Active years

2015–2018

Best venue rank

A

Where they publish

Papers

2 indexed papers, newest first.

YearVenueTitleAuthors
2018DATEGradient importance sampling: An efficient statistical extraction methodology of high-sigma SRAM dynamic characteristics.Thomas Haine, Johan Segers, Denis Flandre, David Bol
2015ISCASAnalysis and optimization for dynamic read stability in 28nm SRAM bitcells.Ahmed T. Elthakeb, Thomas Haine, Denis Flandre, Yehea Ismail, Hamdy Abd Elhamid, David Bol