Timothy J. Bergfeld
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2000–2000
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2000 | DATE | Diagnostic Testing of Embedded Memories Using BIST. | Timothy J. Bergfeld, Dirk Niggemeyer, Elizabeth M. Rudnick |