Tokiko Shiina
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2018–2018
Best venue rank
B
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2018 | KES | Defect Classification of Electronic Board Using Dense SIFT and CNN. | Yuji Iwahori, Yohei Takada, Tokiko Shiina, Yoshinori Adachi, Manas Kamal Bhuyan, Boonserm Kijsirikul |