Skip to content

Tsung-Jung Hsieh

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

2012–2012

Best venue rank

C

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
2012CSCWDA new morphology-based approach for similarity searching on wafer bin maps in semiconductor manufacturing.Tsung-Jung Hsieh, Chung-Shou Liao, Yu-Syuan Huang, Chen-Fu Chien