U. Gtzschmann
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2006–2006
Best venue rank
C
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2006 | DSD | Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes. | Christian Galke, U. Gtzschmann, Heinrich Theodor Vierhaus |