Ubaldo Aleriano Sanchez
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2004–2004
Best venue rank
B
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2004 | SMC | Optical metrology aimed for process quality-control-loops (QCL) in production-modules for micro-technology. | Ubaldo Aleriano Sanchez, Tilo Pfeifer |