V. V. Belkin
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2006–2006
Best venue rank
C
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2006 | DDECS | ISA Based Functional Test Generation with Application to Self-Test of RISC Processors. | V. V. Belkin, S. G. Sharshunov |