| 2020 | ICCAD | Electromigration Checking Using a Stochastic Effective Current Model. | Adam Issa, Valeriy Sukharev, Farid N. Najm |
| 2019 | ICCAD | Power Grid Fixing for Electromigration-induced Voltage Failures. | Zahi Moudallal, Valeriy Sukharev, Farid N. Najm |
| 2017 | ICCAD | Fast physics-based electromigration assessment by efficient solution of linear time-invariant (LTI) systems. | Sandeep Chatterjee, Valeriy Sukharev, Farid N. Najm |
| 2016 | ASPDAC | Electromigration recovery modeling and analysis under time-dependent current and temperature stressing. | Xin Huang, Valeriy Sukharev, Taeyoung Kim, Hai-Bao Chen, Sheldon X.-D. Tan |
| 2016 | DAC | Physics-based full-chip TDDB assessment for BEOL interconnects. | Xin Huang, Valeriy Sukharev, Zhongdong Qi, Taeyoung Kim, Sheldon X.-D. Tan |
| 2016 | DATE | Learning-based dynamic reliability management for dark silicon processor considering EM effects. | Taeyoung Kim, Xin Huang, Hai-Bao Chen, Valeriy Sukharev, Sheldon X.-D. Tan |
| 2016 | ICCAD | Fast physics-based electromigration checking for on-die power grids. | Sandeep Chatterjee, Valeriy Sukharev, Farid N. Najm |
| 2015 | ASPDAC | New electromigration modeling and analysis considering time-varying temperature and current densities. | Hai-Bao Chen, Sheldon X.-D. Tan, Xin Huang, Valeriy Sukharev |
| 2015 | DAC | Interconnect reliability modeling and analysis for multi-branch interconnect trees. | Hai-Bao Chen, Sheldon X.-D. Tan, Valeriy Sukharev, Xin Huang, Taeyoung Kim |
| 2015 | ISLPED | Post placement leakage reduction with stress-enhanced filler cells. | Jun-Ho Choy, Valeriy Sukharev, Armen Kteyan, Henrik Hovsepyan, Ramnath Venkatraman, Ruggero Castagnetti |
| 2014 | DAC | Physics-based Electromigration Assessment for Power Grid Networks. | Xin Huang, Tan Yu, Valeriy Sukharev, Sheldon X.-D. Tan |
| 2014 | ICCAD | Lifetime optimization for real-time embedded systems considering electromigration effects. | Taeyoung Kim, Bowen Zheng, Hai-Bao Chen, Qi Zhu, Valeriy Sukharev, Sheldon X.-D. Tan |
| 2014 | ICCAD | IR-drop based electromigration assessment: parametric failure chip-scale analysis. | Valeriy Sukharev, Xin Huang, Hai-Bao Chen, Sheldon X.-D. Tan |
| 2010 | DAC | Closed-form modeling of layout-dependent mechanical stress. | Vivek Joshi, Valeriy Sukharev, Andres Torres, Kanak Agarwal, Dennis Sylvester, David T. Blaauw |