Varun Mallikarjunan
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2012–2012
Best venue rank
C
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2012 | DSD | Test Generation Approach for Post-Silicon Validation of High End Microprocessor. | Satish Kumar Sadasivam, Sangram Alapati, Varun Mallikarjunan |