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Walter M. Lindermeir

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

3

Venues

2

Active years

1995–1998

Best venue rank

A

Where they publish

Papers

3 indexed papers, newest first.

YearVenueTitleAuthors
1998DATEAnalog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults.Walter M. Lindermeir, Thomas J. Vogels, Helmut E. Graeb
1996ICCADDesign of robust test criteria in analog testing.Walter M. Lindermeir
1995ICCADDesign based analog testing by Characteristic Observation Inference.Walter M. Lindermeir, Helmut E. Graeb, Kurt Antreich