Wlodzimierz Jonca
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2007–2007
Best venue rank
C
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2007 | DDECS | Open Defects Caused by Scratches and Yield Modelling in Deep Sub-micron Integrated Circuit. | Wlodzimierz Jonca |