Yasumi Doi
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
2003–2005
Best venue rank
B
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2005 | ASPDAC | Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation. | Yasumi Doi, Seiji Kajihara, Xiaoqing Wen, Lei Li, Krishnendu Chakrabarty |
| 2003 | ICCD | On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume. | Seiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Chakrabarty |