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Yiyang Jing

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

2017–2017

Best venue rank

C

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
2017SEKEIs the Number of Faults Helpful for Cross-Company Defect Prediction?Yiyang Jing, Jiansheng Zhang, Jin Liu