Zhongyu Shi
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2025–2025
Best venue rank
B
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2025 | ASPDAC | DefectTrackNet: Efficient Root Cause Analysis of Wafer Defects in Semiconductor Manufacturing Using a Lightweight CNN-Transformer Architecture. | Lichao Zeng, Zhouzhouzhou Mei, Zhongyu Shi, Yining Chen |