A Machine Learning Based Approach to Detect Machine Learning Design Patterns.
Weitao Pan, Hironori Washizaki, Nobukazu Yoshioka, Yoshiaki Fukazawa, Foutse Khomh, Yann-Gal Guhneuc
Browse the full APSEC paper archive.
Weitao Pan, Hironori Washizaki, Nobukazu Yoshioka, Yoshiaki Fukazawa, Foutse Khomh, Yann-Gal Guhneuc
Browse the full APSEC paper archive.