Effects of Organizational Changes on Product Metrics and Defects.
Seiji Sato, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Hiroyuki Ono, Yoshiiku Hanai, Mikihiko Yamamoto
Browse the full APSEC paper archive.
Seiji Sato, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Hiroyuki Ono, Yoshiiku Hanai, Mikihiko Yamamoto
Browse the full APSEC paper archive.