PV-ReCAM: Process Variation-Aware Testing for ReRAM-based Content Addressable Memory.
Haneen G. Hezayyin, Mahta Mayahinia, Mehdi B. Tahoori
Browse the full ASPDAC paper archive.
Haneen G. Hezayyin, Mahta Mayahinia, Mehdi B. Tahoori
Browse the full ASPDAC paper archive.