Temperature-independence-point properties for 0.1μm-scale pocket-implant technologies and the impact on circuit design.

Kazuya Hisamitsu, Hiroaki Ueno, Masayasu Tanaka, Daisuke Kitamaru, Mitiko Miura-Mattausch, Hans Jrgen Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama

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