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Random Telegraph Noise Observed on 65-nm Bulk pMOS Transistors at 3.8K.
Takuma Kawakami
,
Takashi Sato
,
Hiromitsu Awano
Venue
B
ASPDAC
Year
2025
Proceedings
ASP-DAC
DBLP record
conf/aspdac/Kawakami0A25 ↗
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