Correlation method of circuit-performance and technology fluctuations for improved design reliability.

D. Miyawaki, Shizunori Matsumoto, Hans Jrgen Mattausch, S. Ooshiro, Masami Suetake, Mitiko Miura-Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama

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