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Paper
wearMeter: an Accurate Wear Metric for NAND Flash Memory.
Min Ye
,
Qiao Li
,
Daniel Wen
,
Tei-Wei Kuo
,
Chun Jason Xue
Venue
B
ASPDAC
Year
2024
Proceedings
ASPDAC
DBLP record
conf/aspdac/Ye0WKX24 ↗
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