Improved device driver reliability through hardware verification reuse.
Leonid Ryzhyk, John Keys, Balachandra Mirla, Arun Raghunath, Mona Vij, Gernot Heiser
Browse the full ASPLOS paper archive.
Leonid Ryzhyk, John Keys, Balachandra Mirla, Arun Raghunath, Mona Vij, Gernot Heiser
Browse the full ASPLOS paper archive.