Measurement Patterns: User-Oriented Strategies for Dealing with Measurements and Dimensions in Making Processes.
Raf Ramakers, Danny Leen, Jeeeun Kim, Kris Luyten, Steven Houben, Tom Veuskens
Browse the full CHI paper archive.
Raf Ramakers, Danny Leen, Jeeeun Kim, Kris Luyten, Steven Houben, Tom Veuskens
Browse the full CHI paper archive.