Identifying Facet Mismatches In Search Via Micrographs.
Sriram Srinivasan, Nikhil S. Rao, Karthik Subbian, Lise Getoor
Browse the full CIKM paper archive.
Sriram Srinivasan, Nikhil S. Rao, Karthik Subbian, Lise Getoor
Browse the full CIKM paper archive.