The impact of GATE thickness variation on FinFET performance parameters.
Dhananjaya Tripathy, Debiprasad Priyabrata Acharya, Prakash Kumar Rout, Debasish Nayak
Browse the full CIT paper archive.
Dhananjaya Tripathy, Debiprasad Priyabrata Acharya, Prakash Kumar Rout, Debasish Nayak
Browse the full CIT paper archive.