The Logistic Random Field - A convenient graphical model for learning parameters for MRF-based labeling.
Marshall F. Tappen, Kegan G. G. Samuel, Craig V. Dean, David M. Lyle
Browse the full CVPR paper archive.
Marshall F. Tappen, Kegan G. G. Samuel, Craig V. Dean, David M. Lyle
Browse the full CVPR paper archive.