Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
DAC
/
Paper
LSI layout checking using bipolar device recognition technique.
C. S. Chang
Venue
A*
DAC
Year
1979
Proceedings
DAC
DBLP record
conf/dac/Chang79 ↗
Browse the full
DAC paper archive
.