Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
DAC
/
Paper
Hot-Carrier Reliability Enhancement via Input Reordering and Transistor Sizing.
Aurobindo Dasgupta
,
Ramesh Karri
Venue
A*
DAC
Year
1996
Proceedings
DAC
DBLP record
conf/dac/DasguptaK96a ↗
Browse the full
DAC paper archive
.