Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
DAC
/
Paper
Automatic test generation for stuck-open faults in CMOS VLSI.
Yacoub M. El-Ziq
Venue
A*
DAC
Year
1981
Proceedings
DAC
DBLP record
conf/dac/El-Ziq81 ↗
Browse the full
DAC paper archive
.