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YAPI: application modeling for signal processing systems.

Erwin A. de Kock, W. J. M. Smits, Pieter van der Wolf, Jean-Yves Brunel, W. M. Kruijtzer, Paul Lieverse, Kees A. Vissers, Gerben Essink

VenueA*DAC
Year2000
ProceedingsDAC

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