Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
DAC
/
Paper
Testing functional faults in VLSI.
Yinghua Min
,
Stephen Y. H. Su
Venue
A*
DAC
Year
1982
Proceedings
DAC
DBLP record
conf/dac/MinS82 ↗
Browse the full
DAC paper archive
.