A layout checking system for large scale integrated circuits.
Kenji Yoshida, Takashi Mitsuhashi, Yasuo Nakada, Toshiaki Chiba, Kiyoshi Ogita, Shinji Nakatsuka
Browse the full DAC paper archive.
Kenji Yoshida, Takashi Mitsuhashi, Yasuo Nakada, Toshiaki Chiba, Kiyoshi Ogita, Shinji Nakatsuka
Browse the full DAC paper archive.