Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
DATE
/
Paper
Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs.
Hamidreza Hashempour
,
Fabrizio Lombardi
Venue
A
DATE
Year
2007
Proceedings
DATE
DBLP record
conf/date/HashempourL07 ↗
Browse the full
DATE paper archive
.