On-chip aging sensor to monitor NBTI effect in nano-scale SRAM.
Arthur Ceratti, Thiago Copetti, Letcia Maria Bolzani Poehls, Fabian Vargas
Browse the full DDECS paper archive.
Arthur Ceratti, Thiago Copetti, Letcia Maria Bolzani Poehls, Fabian Vargas
Browse the full DDECS paper archive.