Skip to content

QuFI: a Quantum Fault Injector to Measure the Reliability of Qubits and Quantum Circuits.

Daniel Oliveira, Edoardo Giusto, Emanuele Dri, Nadir Casciola, Betis Baheri, Qiang Guan, Bartolomeo Montrucchio, Paolo Rech

VenueADSN
Year2022
ProceedingsDSN

Browse the full DSN paper archive.