Automatic Check-Out via Prototype-Based Classifier Learning from Single-Product Exemplars.
Hao Chen, Xiu-Shen Wei, Faen Zhang, Yang Shen, Hui Xu, Liang Xiao
Browse the full ECCV paper archive.
Hao Chen, Xiu-Shen Wei, Faen Zhang, Yang Shen, Hui Xu, Liang Xiao
Browse the full ECCV paper archive.