Code Churn: A Neglected Metric in Effort-Aware Just-in-Time Defect Prediction.
Jinping Liu, Yuming Zhou, Yibiao Yang, Hongmin Lu, Baowen Xu
Browse the full ESEM paper archive.
Jinping Liu, Yuming Zhou, Yibiao Yang, Hongmin Lu, Baowen Xu
Browse the full ESEM paper archive.