LESS is More for I/O-Efficient Repairs in Erasure-Coded Storage.
Keyun Cheng, Guodong Li, Xiaolu Li, Sihuang Hu, Patrick P. C. Lee
Browse the full FAST paper archive.
Keyun Cheng, Guodong Li, Xiaolu Li, Sihuang Hu, Patrick P. C. Lee
Browse the full FAST paper archive.