An In-Depth Study of Correlated Failures in Production SSD-Based Data Centers.
Shujie Han, Patrick P. C. Lee, Fan Xu, Yi Liu, Cheng He, Jiongzhou Liu
Browse the full FAST paper archive.
Shujie Han, Patrick P. C. Lee, Fan Xu, Yi Liu, Cheng He, Jiongzhou Liu
Browse the full FAST paper archive.