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A New Analysis of Best Fit Bin Packing.

VenueNationalFUN

Year2012

ProceedingsFUN

DBLP recordconf/fun/Sgall12 ↗

Browse the full FUN paper archive.

Subfields

Artificial Intelligence
Machine Learning
Computer Vision
Natural Language Processing
Security and Privacy
Systems and Networking
Databases and Data Management
Data Science and Information Retrieval

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